#include <tms570_selftest_parity.h>

Data Fields
unsigned char	esm_prim_grp

unsigned char	esm_prim_chan

unsigned char	esm_sec_grp

unsigned char	esm_sec_chan

int	fail_code

volatile uint32_t *	ram_loc

volatile uint32_t *	par_loc

uint32_t	par_xor

volatile uint32_t *	par_cr_reg

uint32_t	par_cr_test

volatile uint32_t *	par_st_reg

uint32_t	par_st_clear

tms570_selftest_par_fnc_t *	partest_fnc

volatile void *	fnc_data

Detailed Description

Decriptor specifying registers addresses and values used to test that parity protection is working for given hardware module/peripheral. It is used during initial chip self-tests.

Field Documentation

◆ esm_prim_chan

unsigned char tms570_selftest_par_desc::esm_prim_chan

ESM primary signalling channel number.

◆ esm_prim_grp

unsigned char tms570_selftest_par_desc::esm_prim_grp

ESM primary signalling group number.

◆ esm_sec_chan

unsigned char tms570_selftest_par_desc::esm_sec_chan

ESM optional/alternative signalling channel.

◆ esm_sec_grp

unsigned char tms570_selftest_par_desc::esm_sec_grp

ESM optional/alternative signalling group.

◆ fail_code

int tms570_selftest_par_desc::fail_code

Error code reported to bsp_selftest_fail_notification() in the case of the test failure.

◆ fnc_data

volatile void* tms570_selftest_par_desc::fnc_data

Pointer to the base of tested peripheral registers. It is required by some test functions (CAN and MibSPI)

◆ par_cr_reg

volatile uint32_t* tms570_selftest_par_desc::par_cr_reg

Address of module parity test control register.

◆ par_cr_test

uint32_t tms570_selftest_par_desc::par_cr_test

Mask of bit which cause switch to a test mode.

◆ par_loc

volatile uint32_t* tms570_selftest_par_desc::par_loc

Address of mapping of parity bits into CPU address space.

◆ par_st_clear

uint32_t tms570_selftest_par_desc::par_st_clear

Optional value which is written to status register to clear error.

◆ par_st_reg

volatile uint32_t* tms570_selftest_par_desc::par_st_reg

Optional module parity status register which.

◆ par_xor

uint32_t tms570_selftest_par_desc::par_xor

Bitmask used to alter parity to cause intentional parity failure.

◆ partest_fnc

tms570_selftest_par_fnc_t* tms570_selftest_par_desc::partest_fnc

Function which specialized for given kind of peripheral/module mechanism testing.

◆ ram_loc

volatile uint32_t* tms570_selftest_par_desc::ram_loc

Address of memory protected by parity.

The documentation for this struct was generated from the following file:

bsps/arm/tms570/include/bsp/tms570_selftest_parity.h

Data Fields